IEC 61967-4 PDF

IEC +AMD CSV Standard | Integrated circuits – Measurement of electromagnetic emissions, kHz to 1 GHz – Part 4. IEC INTEGRATED CIRCUITS – MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, KHZ TO 1 GHZ – PART 4: MEASUREMENT OF. Buy IEC INTEGRATED CIRCUITS – MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, KHZ TO 1 GHZ – PART 4: MEASUREMENT OF.

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The P probe corresponds to the 1 Ohm RF current probe head. The P probe corresponds to the impedance matching network according to IEC It has an input impedance of Ohm. The P and P probe can also be used for other measurement 619967-4. It backs up the IC in the circuit diagrams Figure 2 and Figure 4. The external capacitor C ext can reduce the stress on the signal pin caused by the probe’s low impedance 1 Ohm Figure 6 during current measurements on signal isc.

The impedance of the capacitor C ext should be at least 3 dB smaller than the shunt’s 1 Ohm resistance. An IC internal connection to other Vdd supply 619674- is assumed for a voltage measurement on a Vdd pin Figure 7. This measurement enables the determination of voltage dips on the IC’s internal Vdd network.

The test IC is soldered to the test board Figure 8. Unlike the measurement set-up according to IECthis set-up ensures that the P or P probe’s pin contact can reach and contact each IC pin. The probes are fixed on the ground plane with magnets. Filter elements and bridges are located on the underside bottom of the test board to prepare the measurement set-up for contact with the probe Figure The same test board is used for all measurement methods 1 Ohm, Ohm.

The measurement is performed with a 1 Ohm shunt. The input of the current probe head is connected to the probe’s pin contact Figure The output of the current probe head is connected to the 50 Ohm SMB port at the rear end of the probe.

A cable is used to connect the probe’s output to a measuring instrument such as a spectrum analyser. The voltage measured is equivalent to the current measured. Figure 13 shows the equivalent circuit diagram of the P probe.

IEC 61967-4 Ed. 1.0 b Cor.1(2017)

An additional capacitor C ext can be inserted between the test IC and the probe to reduce the stress on the signal pins caused by the 1 Ohm shunt.

The P current probe head has an inductance L P of 1 nH in the line from the tip of the probe contact to the shunt. This value and the associated measurement error are much smaller than the value achieved with the set-up according to IEC The pin contact of the probe has to 69167-4 brought into contact with the respective test IC pin to perform the measurement.

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The measurement is performed with a Ohm voltage divider.

The input of the matching network is connected to the probe’s pin contact Figure The output of the matching network is connected to the 50 Ohm SMB port at the rear end of the probe. Figure 17 shows the equivalent circuit diagram of the P probe.

Measuring the Electromagnetic Emissions of Integrated Circuits with IEC 61967-4

The matching network comprises a Ohm — 51 Ohm voltage divider and a 6. Figure 19 shows the measurement set-up to measure conducted emissions from integrated circuits ICs.

The test IC is mounted on the test board. The test board is inserted into the corresponding ground adapter such as GNDA The signal and supply connections to the test IC are established through a plug connector on the test board. The test IC is supplied via the test board and controlled via the connection board.

The respective pin of the test IC can be contacted with the pin contact by moving the probe manually. The microscope camera Figure 19 optically detects if and when contact is made. The video image on the PC monitor enables the user to assess the connection to the respective IC pin. The spectrum analyser displays the RF signal that occurs if and when contact is made.

The ICT1 automatic tester enables automatic measurements. The main settings of the spectrum analyser have to be defined in the “Spectrum Analyser Manager” Figure The correction curve K or K has to be used for this purpose.

Mathematical functions can also be used Figure The “Corrections Selector” window opens Figure Other correction factors and correction curves Figure 25 such as K or K can be loaded in the same way or selectively Figure The correction curve K is loaded to the “Corrections Selector” if the P probe is used for the measurement.

A measurement log can be kept in the free text field under “Comment”.

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irc The “Curve” number is counted automatically Curve 3 under “Annotation”. The measurement log can be kept in the respective free text field under “Comment”. The correction can also be made later on if the measurement has been 6167-4 out using the P probe without any correction. The user is responsible for measures to ensure that the intended use of products which are installed outside the 6196-74 EMC environment is not adversely effected particularly by disturbance emission.

Langer EMV-Technik GmbH will remedy any fault due to defective material or defective manufacture, either by repair or by delivery of replacement, during the statutory warranty period.

Figure 1 Test set-up according to IEC with the P 1 Ohm RF current probe head current measurement and the P impedance matching network voltage measurement The P and P probe can also be used for other measurement tasks: Figure 3 P, current measurement on a single Vss pin Figure 4 P, current measurement on a single Vdd pin Figure 5 P, voltage measurement on a signal pin while this is in operation Figure 6 P, current measurement on a signal pin while this is in operation The external capacitor C ext can reduce the stress on the signal pin caused by the probe’s low impedance 1 Ohm Figure 6 during current measurements on signal pins.

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Figure 7 P, voltage measurement on a Vdd pin; analogous current measurement with the P probe An IC internal connection to other Vdd supply pins is assumed for a voltage measurement on a Vdd pin Figure 7. Figure 8 Measurement set-up according to the 1 Ohm method with P and the Ohm method with P Figure 9 Sectional view of the measurement set-up The same test board is used for all measurement methods 1 Ohm, Ohm. Figure 10Design of the test board; top with Vss bridges, bottom with back-up capacitors, filters and quartz crystal oscillator circuit 2 P probe 2.

Figure 11 P probe 2. Figure 13 Internal P design Figure 13 shows the equivalent circuit diagram of the P probe. Figure 15 P probe 3. Figure 6197-4 Internal P design Figure 17 shows the equivalent circuit diagram of the P probe. Figure 20 Test set-up with the P probe set and ICE1 test environment without a control unit and microscope camera Figure 21 Pin contact visualised with the digital microscope camera 4.

Figure 22 Connecting the spectrum analyser to the PC Figure 23 Main settings of the spectrum analyser in the “Spectrum Analyser Manager” right side The main settings of the spectrum analyser have to be defined in the “Spectrum Analyser Manager” Figure Figure 25 Loading the correction curves K to the “Corrections Selector” The correction curve K is loaded to the “Corrections Selector” 61967–4 the P probe is used for the measurement.

You can find the correction curve K in the “Corrections” list of the “Trace Manager”.

Langer EMV – S / S set, 1 Ohm / Ohm, Conducted RF Measurement acc. IEC

Read and comply with the operating manual and keep the it in a safe place for subsequent use. Only personnel who are qualified in the field of EMC and fit for working under the influence of disturbance voltages and magnetic as well as electric fields may use the device.

Follow the safety instructions and warnings on the unit. Read the explanation of the symbols on jec unit in the operating manual.

Any other use is not permitted. Damaged connection cables must be replaced!

This warranty is only granted on condition that: The warranty will be forfeited if: Instructions for the development of the adapter board Test process. Figure 30 P characteristic. Figure 31 P characteristic.